10~84GHz variable temperature Dk ,Df testing of Low-dielectric material.
Feature:
Provide the actual measured frequencies of the empty cavity and the sample.
Single frequencies of sample is measurable
Compatible with Keysight, R&S, Anritsu and all bands VNAs
Loss tangent resolution down to the hundred thousandths place
Automatic testing from -50 to 150°C is available, with HT-150-C test chamber
Technical Specification:
Frequency range: 10 ~84 GHz
Dielectric constant: Dk: (2-10) 1.0% , Df of order 1.0 x 10-4
Sample thickness: 0.1~0.8mm (depends on frequency )
Sample size (L*W) : 6*5 cm depend on SCRN
Temperature: -50°C – 150 °C
Supported standards: IPC-TM-650 2.5.5.13
