Design for 10~30GHz variable temperature Dk Df testing of Low-dielectric material.
Feature:
Provide the actual measured frequencies of the empty cavity and the sample.
Muti frequencies of sample is measurable
Compatible with Keysight, R&S, Anritsu and all bands VNAs
Loss tangent resolution down to the hundred thousandths place
Automatic testing from -50 to 150°C is available, with HT-150-C test chamber
Technical Specification:
Frequency range: 10 ~30 GHz
Dielectric constant: Dk: (2-10) 1.0% , Df of order 1.0 x 10-4
Sample thickness: 0.5 mm (depends on frequency)
Sample size (L*W) : 6~8 cm
Temperature: -50°C – 150 °C
Supported standards: IPC-TM-650 2.5.5.13
