SCR – Split Cylinder Resonator
Specialized 10 GHz – 30 GHz Dk/Df Characterization for Low-Loss Dielectrics
The SCR is a high-precision measurement system optimized for the 10 GHz to 30 GHz frequency band. Designed for accuracy and repeatability, it provides engineers with a robust method for evaluating low-dielectric materials under both ambient and extreme thermal conditions.
Key Advantages
- Multi-Frequency Versatility: Unlike single-mode resonators, the SCR enables multi-frequency measurements of a single sample, providing a comprehensive data profile across the 10–30 GHz spectrum.
- Transparent Data Verification: Delivers real-time, actual measured frequencies for both the empty cavity and the sample, ensuring absolute confidence in your test results.
- High-Sensitivity Analysis: Features an industry-leading loss tangent (Df) resolution down to the hundred-thousandths place (0.00001), capturing the subtle nuances of premium low-loss substrates.
- Automated Thermal Profiling: Fully compatible with the HT-150-C test chamber, allowing for unattended, automated testing from -50°C to 150°C to observe dielectric stability over temperature.
- Global Compatibility: Seamlessly integrates with all major Vector Network Analyzers (VNA), including Keysight, Rohde & Schwarz (R&S), and Anritsu.
Technical Specifications
| Parameter | Specification |
|---|---|
| Frequency Range | 10 GHz – 30 GHz |
| Dielectric Constant (Dk) | Range: 2.0 – 10.0 (Accuracy: ±1.0%) |
| Dissipation Factor (Df) | Magnitude of 1.0×10−4 |
| Optimal Sample Thickness | 0.5 mm (Frequency dependent) |
| Specimen Dimensions | 6×8 cm |
| Temperature Range | -50°C to +150°C |
| Standard Compliance | IPC-TM-650 2.5.5.13 |
